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	Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE)
	Yang P. ; Ai H.
	2010
会议名称	6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010
会议地点	Hangzhou, China
关键词	Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity polarization phase plate primary aberrations STED pulse shape pulse duration and delay time. In this paper we found related models and simulate the relationship between the depletion patterns and the parameters and put forward effective approach to enhance the system resolution. 2010 SPIE.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33790]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Yang P.,Ai H.. Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE)[C]. 见:6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010. Hangzhou, China.

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