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Identification of impurities in macrolides by liquid chromatography-mass spectrometric detection and prediction of retention times of impurities by constructing quantitative structure-retention relationship (QSRR) 期刊论文
2017, 卷号: 145, 页码: 262-272
作者:  Zhang, Xia;  Li, Jin;  Wang, Chen;  Song, Danqing;  Hu, Changqin
收藏  |  浏览/下载:3/0  |  提交时间:2020/01/03
Development of an impurity-profiling method for source identification of spilled benzene series compounds by gas chromatography with mass spectrometry: Toluene as a case study 期刊论文
JOURNAL OF SEPARATION SCIENCE, 2015, 卷号: 38, 期号: 18, 页码: 3198-3204
作者:  Han, Bin;  Chen, Junhui;  Zheng, Li;  Zhou, Tao;  Li, Jingxi
收藏  |  浏览/下载:5/0  |  提交时间:2019/08/19
Development of an impurity-profiling method for source identification of spilled benzene series compounds by gas chromatography with mass spectrometry: Toluene as a case study 期刊论文
JOURNAL OF SEPARATION SCIENCE, 2015, 卷号: 38, 期号: 18, 页码: 3198-3204
作者:  Han, Bin;  Chen, Junhui;  Zheng, Li;  Zhou, Tao;  Li, Jingxi
收藏  |  浏览/下载:2/0  |  提交时间:2018/12/07
Laser-induced breakdown spectroscopic characterization of impurity deposition on the first wall of a magnetic confined fusion device: Experimental Advanced Superconducting Tokamak 期刊论文
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2013, 卷号: 87, 页码: 147-152
作者:  Hai, Ran;  Farid, Nazar;  Zhao, Dongye;  Zhang, Lei;  Liu, Jiahong
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/11
Carrier Profiling of Individual Si Nanowires by Scanning Spreading Resistance Microscopy 期刊论文
NANO LETTERS, 2010, 卷号: 10, 期号: 1, 页码: 171-175
Ou, X; Das Kanungo, P; Kogler, R; Werner, P; Gosele, U; Skorupa, W; Wang, X
收藏  |  浏览/下载:15/0  |  提交时间:2012/03/24
Semiconductor Laser 专利
专利号: GB2369725A, 申请日期: 2002-06-05, 公开日期: 2002-06-05
作者:  JOHN, HAIG, MARSH;  CRAIG, JAMES, HAMILTON;  OLEK, PETER, KOWALSKI
收藏  |  浏览/下载:16/0  |  提交时间:2020/01/18
Impurity profiling in bulk pharmaceutical batches using F-19 NMR spectroscopy and distinction between monomeric and dimeric impurities by NMR-based diffusion measurements 期刊论文
JOURNAL OF PHARMACEUTICAL AND BIOMEDICAL ANALYSIS, 1999, 卷号: 19, 期号: 3-4, 页码: 511-517
作者:  Mistry, N;  Ismail, IM;  Farrant, RD;  Liu, ML;  Nicholson, JK
收藏  |  浏览/下载:29/0  |  提交时间:2015/12/01
DETERMINATION OF DEPTH PROFILING OF METAL TRACE IMPURITIES ON SI SURFACE USING TOTAL REFLECTION X-RAY-FLUORESCENCE 期刊论文
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1993, 卷号: 345, 期号: 7, 页码: 518-520
作者:  Fan QM(范钦敏);  Liu YW(刘亚雯);  LI, DL;  Wei CL(魏诚林);  FAN, QM
收藏  |  浏览/下载:16/0  |  提交时间:2016/06/28


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