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浏览/检索结果: 共17条，第1-10条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Source-drain resistance characteristics of back-channel etched amorphous InGaZnO thin film transistors with TiO2:Nb protective layer 期刊论文 MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2017 Zhang, Letao; Zhou, Xiaoliang; Chang, Baozhu; Wang, Longyan; Xiao, Yuxiang; He, Hongyu; Zhang, Shengdong 收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03 Amorphous indium gallium zinc oxide  Thin film transistors  Source-drain parasitic resistance  TiO2:Nb  Films thickness  THRESHOLD VOLTAGE  ANATASE TIO2  PERFORMANCE  SHIFT  TFTS   Nb Doped TiO2 Protected Back-Channel-Etched Amorphous InGaZnO Thin Film Transistors 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2017 Zhang, Letao; Zhou, Xiaoliang; Yang, Huan; He, Hongyu; Wang, Longyan; Zhang, Min; Zhang, Shengdong 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Amorphous indium gallium zinc oxide (a-IGZO)  thin film transistors (TFTs)  back-channel-etch (BCE) process  Nb doped TiO2  THRESHOLD VOLTAGE  CARBON-NANOFILM  BARRIER LAYER  PERFORMANCE  SHIFT   A Back-Channel-Etched Amorphous InGaZnO Thin-Film Transistor Technology With Al-Doped ZnO as Source/Drain and Pixel Electrodes 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016 Deng, Wei; Xiao, Xiang; Shao, Yang; Song, Zhen; Lee, Chia-Yu; Lien, Alan; Zhang, Shengdong 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Aluminum-doped ZnO (AZO)  amorphous indium-gallium-zinc oxide (a-IGZO)  back-channel-etch (BCE)  pixel electrode (PE)  thin-film transistor (TFT)  wet etch  THRESHOLD VOLTAGE  PERFORMANCE  DAMAGE  LAYER  TFTS  SIO2   Investigation into sand mura effects of a-IGZO TFT LCDs 期刊论文 MICROELECTRONICS RELIABILITY, 2016 Liu, Xiang; Hu, Hehe; Ning, Ce; Shang, Guangliang; Yang, Wei; Wang, Ke; Lu, Xinhong; Lee, Woobong; Wang, Gang; Xue, Jianshe; Jun, Jung Mok; Zhang, Shengdong 收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03 a-IGZO TFTs  LCD reliability test  Sand mura  Threshold voltage shift  Positive  Thermal gate bias stress  THIN-FILM TRANSISTORS   High reliability of IGZO TFTs using low-temperature fabricated organic passivation layers 其他 2016-01-01 Huiling Lu; Ting Liang; Shengdong Zhang 收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03 swing  degraded  resist  indium  amorphous  remarkably  sputtering  annealing  candidate  magnetron  swing  degraded  resist  indium  amorphous  remarkably  sputtering  annealing  candidate  magnetron   Back Channel Anodization Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors Process 期刊论文 ieee electron device letters, 2015 Xiao, Xiang; Shao, Yang; He, Xin; Deng, Wei; Zhang, Letao; Zhang, Shengdong 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/11 Amorphous indium gallium zinc oxide (a-IGZO)  thin-film transistors (TFTs)  back channel anodization (BCA)  low temperature   Performance and Stability Improvements of Back-Channel-Etched Amorphous Indium-Gallium-Zinc Thin-Film-Transistors by CF4+O-2 Plasma Treatment 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2015 Liu, Xiang; Wang, Lisa Ling; Hu, Hehe; Lu, Xinhong; Wang, Ke; Wang, Gang; Zhang, Shengdong 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 a-IGZO TFTs  back-channel-etch (BCE)  plasma treatment  threshold voltage shift  THRESHOLD VOLTAGE  SHIFT  OXIDE  GATE   Comparative study of a-IGZO TFTs with direct current and radio frequency sputtered channel layers 期刊论文 JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2015 Deng, Wei; Xiao, Xiang; He, Xin; Lee, Chia-Yu; Zhang, Shengdong 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 amorphous indium-gallium-zinc oxide (a-IGZO)  RF sputtering  DC sputtering  oxygen vacancy  stability  THIN-FILM TRANSISTORS  TRANSPORT   Low-Voltage a-InGaZnO Thin-Film Transistors With Anodized Thin HfO2 Gate Dielectric 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2015 Shao, Yang; Xiao, Xiang; He, Xin; Deng, Wei; Zhang, Shengdong 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 Amorphous indium-gallium-zinc oxide (a-IGZO)  anodized HfO2  high-k  low voltage  thin-film transistors (TFTs)  OXIDE  TEMPERATURE  ALUMINUM   Gate Bias Stress-Induced Threshold Voltage Shift Effect of a-IGZO TFTs with Cu Gate 期刊论文 ieee电子器件汇刊, 2014 Liu, Xiang; Wang, Lisa Ling; Ning, Ce; Hu, Hehe; Yang, Wei; Wang, Ke; Yoo, Seong Yeol; Zhang, Shengdong 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10 Amorphous indium gallium zinc oxide thin-film transistors (a-IGZO TFTs)  copper diffusion  copper gate  stacked gate insulator  threshold voltage shift  THIN-FILM TRANSISTORS