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浏览/检索结果: 共2条，第1-2条 帮助 限定条件 专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 High beam quality all-solid-state 1053nm nd: Glass amplifier shaping by LCSLM at repetition frequency (EI CONFERENCE) 会议论文 2nd International Conference on Optical, Electronic Materials and Applications 2012, OEMA 2012, May 25, 2012 - May 26, 2012, Chongqing, China Qiu J.; Fan Z.; Tang X.; Lian F.; Zhang X.; Ma Y. 收藏  |  浏览/下载：74/0  |  提交时间：2013/03/25 A laser amplifier of LD pumping Nd: glass with a high beam quality and stability  the modulation degree near field is less than 1.23:1. (2012) Trans Tech Publications  which amplifies nanosecond laser pulse  Switzerland.  has been developed in this paper. Under 1Hz repetition frequency  when the flat top pulse of 3 ns width and 1 nJ energy is injected as the seed pulse  the average output energy of the laser amplifier is 115.3 mJ with a net gain of 109  the energy dispersion degree of the outputting laser is no more than 2%   Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China Jin W.; Jin C.; Liu L.; Zhu H.; Yang H. 收藏  |  浏览/下载：14/0  |  提交时间：2013/03/25 We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.