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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 发表日期：2015     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Research on Mechanical Reliability of a Permanent Magnetic Actuator for a 126kV Vacuum Circuit Breaker 会议论文 作者:  Li, Haomin;  Sun, Liqiong;  Yao, Xiaofei;  Geng, Yingsan;  Liu, Zhiyuan 收藏  |  浏览/下载：6/0  |  提交时间：2019/12/02 vacuum circuit breaker Introduction  impact anasysis  permanent magnetic actuator  mechanical reliability   Research on mechanical reliability of a permanent magnetic actuator for a 126kV vacuum circuit breaker 会议论文 作者:  Li, Haomin;  Sun, Liqiong;  Yao, Xiaofei;  Geng, Yingsan;  Liu, Zhiyuan 收藏  |  浏览/下载：3/0  |  提交时间：2019/12/02 impact anasysis  mechanical reliability  permanent magnetic actuator  vacuum circuit breaker Introduction   Accelerated Aging in Analog and Digital Circuits With Feedback 期刊论文 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015 Sutaria, Ketul B.; Mohanty, Abinash; Wang, Runsheng; Huang, Ru; Cao, Yu 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Circuit aging  bias runaway  BTI  CHC  DVS  aging models and simulation framework  BIAS TEMPERATURE INSTABILITY  HOT-CARRIER DEGRADATION  DEEP-SUBMICRON NMOSFETS  E-E SCATTERING  NBTI  RELIABILITY  SIMULATION  DESIGN  CROSS  MODEL   Impact of Temporal Transistor Variations on Circuit Reliability 其他 2015-01-01 Wang, Runsheng; Cao, Yu 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 circuit reliability  temporal variation  bias temperature instability (BTI)  random telegraph noise (RTN)   Configuration Circuit Design for Bum-in Test of CLB Based on Structure 会议论文 2015 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM), 2015-01-01 作者:  Gao, Cheng;  Liu, Haitian;  Wang, Xiangfen;  Huang, Jiaoying 收藏  |  浏览/下载：4/0  |  提交时间：2020/01/06 Reliability  Burn-in  CLB  Configuration Circuit  FPGA   Multiplexing Sense-Amplifier-Based Magnetic Flip-Flop in a 28-nm FDSOI Technology 期刊论文 IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2015, 卷号: 14, 页码: 761-767 作者:  Cai, Hao;  Wang, You;  Zhao, Weisheng;  Naviner, Lirida Alves de Barros 收藏  |  浏览/下载：2/0  |  提交时间：2020/01/06 FDSOI technology  flip-flops  integrated circuit reliability  magnetic tunneling