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浏览/检索结果: 共3条，第1-3条 帮助 限定条件 发表日期：2011     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Influence of growth temperatures on the quality of InGaAs/GaAs quantum well structure grown on Ge substrate by molecular beam epitaxy 期刊论文 journal of semiconductors, 2011, 卷号: 32, 期号: 4, 页码: 43004 He, Jifang; Shang, Xiangjun; Li, Mifeng; Zhu, Yan; Chang, Xiuying; Ni, Haiqiao; Xu, Yingqiang; Niu, Zhichuan 收藏  |  浏览/下载：76/0  |  提交时间：2012/06/14 Atomic force microscopy  Buffer layers  Epitaxial growth  Gallium alloys  Gallium arsenide  Germanium  Growth temperature  High resolution transmission electron microscopy  Molecular beam epitaxy  Molecular beams  Semiconducting gallium  Semiconductor device structures  Semiconductor quantum wells   2-5m InAs/GaSb superlattices infrared photodetector 期刊论文 hongwai yu jiguang gongcheng/infrared and laser engineering, 2011, 卷号: 40, 期号: 8, 页码: 1403-1406 Xu, Yingqiang; Tang, Bao; Wang, Guowei; Ren, Zhengwei; Niu, Zhichuan 收藏  |  浏览/下载：21/0  |  提交时间：2012/06/14 Alignment  Atomic force microscopy  Atomic spectroscopy  Detectors  Epitaxial growth  Gallium alloys  Gallium arsenide  Indium arsenide  Infrared detectors  Molecular beam epitaxy  Molecular beams  Optoelectronic devices  Semiconducting gallium  Superlattices  Transmission electron microscopy  X ray diffraction   Thermal stability of Cu/Si (111) films prepared by ionized cluster beam technique 会议论文 2011 International Conference on Advanced Engineering Materials and Technology, AEMT 2011, Sanya, China, July 29, 2011 - July 31, 2011 作者:  Cao, Bo;  Jia, Yanhui;  Li, Gongping;  Cho, Seong Jin;  Kim, Hee 收藏  |  浏览/下载：3/0  |  提交时间：2017/01/20 Film preparation  Annealing  Backscattering  Copper  Diffraction  Diffusion  Ionization  Ions  Metallic films  Rutherford backscattering spectroscopy  Silicides  Silicon  Spectrometry  Thermodynamic stability  X ray diffraction  Annealing temperatures  Atomic diffusions  Cu films  Interface reaction  Interface reactions  Ionized cluster beam (ICB)  Ionized cluster beams  P-type Si  Rutherford backscattering spectrometry  Rutherford backscattering spectrometry (RBS)  Si atoms  Si substrates  Thermally stable  X-ray diffraction (XRD)  XRD