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BP neural network application on surface temperature measurement system based on colorimetry (EI CONFERENCE) 会议论文
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, July 8, 2007 - July 12, 2007, Chengdu, China
Sun Z.-Y.; Cai S.; Qiao Y.-F.; Zhu W.
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