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	BP neural network application on surface temperature measurement system based on colorimetry (EI CONFERENCE)
	Sun Z.-Y. ; Cai S. ; Qiao Y.-F. ; Zhu W.
	2007
会议名称	3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, July 8, 2007 - July 12, 2007
会议地点	Chengdu, China
关键词	Measurement of the features of infrared radiation is very important for the precaution and discrimination of missiles and relevant research is worthy in military application. The measurement of target's surface temperature is the foundation of infrared radiation characteristics measurement. The principle and configuration of target's surface temperature measurement system based on colorimetry is introduced the measurement model is deduced and the processes of temperature measurement are presented. Least-square method and back-propagation neural network method are both used to deal with the demarcating data. Compared with the least-square method Back-propagation neural network has more advantages such as high precision good applicability and so on.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33754]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Sun Z.-Y.,Cai S.,Qiao Y.-F.,et al. BP neural network application on surface temperature measurement system based on colorimetry (EI CONFERENCE)[C]. 见:3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, July 8, 2007 - July 12, 2007. Chengdu, China.

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