×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
北京大学 [45]
武汉大学 [2]
内容类型
其他 [47]
发表日期
2017 [3]
2016 [6]
2015 [4]
2014 [6]
2013 [2]
2012 [6]
更多...
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共47条,第1-10条
帮助
限定条件
内容类型:其他
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
A High Accuracy and Robust Machine Learning Network for Pattern Recognition Based on Binary RRAM devices
其他
2017-01-01
Liu, Chen
;
Han, Runze
;
Zhang, Sheng
;
Li, Maochuan
;
Zhou, Zheng
;
Huang, Peng
;
Liu, Lifeng
;
Liu, Xiaoyan
;
Kang, Jinfeng
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Online Multi-threshold Learning with Imbalanced Data Stream
其他
2017-01-01
作者:
Cai, Xufen
;
Yang, Min
;
Zhu, Rong
;
Li, Xiaoyan
;
Ye, Long
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/05
Online learning
Imbalanced data
Multi-threshold
F-measure
Online Multi-threshold Learning with Imbalanced Data Stream
其他
2017-01-01
作者:
Cai, Xufen
;
Yang, Min
;
Zhu, Rong
;
Li, Xiaoyan
;
Ye, Long
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/05
Online learning
Imbalanced data
Multi-threshold
F-measure
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions
其他
2016-01-01
Li, Yun
;
Jiang, Hai
;
Lun, Zhiyuan
;
Wang, Yijiao
;
Huang, Peng
;
Hao, Hao
;
Du, Gang
;
Zhang, Xing
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
OXIDE
MODEL
BIAS
DEGRADATION
TECHNOLOGY
DEFECTS
STACKS
NOISE
PBTI
HFO2
Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method
其他
2016-01-01
Li, Yun
;
Lun, Zhiyuan
;
Wang, Yijiao
;
Huang, Peng
;
Jiang, Hai
;
Zhang, Xing
;
Du, Gang
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
Characterization of Self-heating Leads to Universal Scaling of HCI Degradation of Multi-Fin SOI FinFETs
其他
2016-01-01
Jiang, Hai
;
Shin, SangHoon
;
Liu, Xiaoyan
;
Zhang, Xing
;
Alam, Muhammad Ashraful
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
Self-heating
Hot carrier injection
Thermal circuit model
universal degradation
Gate-all-around transistors
HOT-CARRIER DEGRADATION
SHORT-CHANNEL TRANSISTORS
TRANSPORT
MOSFETS
DEVICES
NBTI
Performance Evaluation and Optimization of Single Layer MoS2 Double Gate Transistors with metallic contacts
其他
2016-01-01
Zeng, Lang
;
Gong, Fanghui
;
Nan, Jiang
;
Huang, Yangqi
;
Zhang, He
;
Liu, Xiaoyan
;
Zhang, Youguang
;
Zhao, Weisheng
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
Improved Crystallinity of Ultra-thin Amorphous Film By 2D-limited Regrowth: Process and Characterization
其他
2016-01-01
Yuancheng Yang
;
Ming Li
;
Gong Chen
;
Hao Zhang
;
Xiaoyan Xu
;
Ru Huang
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Monolithic 3D integration
Amorphous silicon
Two Dimensional(2D) Recrystallization
Capping layer
Monolithic 3D integration
Amorphous silicon
Two Dimensional(2D) Recrystallization
Capping layer
Investigation the Impact of Composition on the Performance of SiGe Nanowire pMOSFETs by Different Simulation Methods
其他
2016-01-01
Xianle Zhang
;
Xiaoyan Liu
;
Yijiao Wang
;
Longxiang Yin
;
Gang Du
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
drift
Poisson
solver
SiGe
default
deviation
beyond
drain
calibration
executed
drift
Poisson
solver
SiGe
default
deviation
beyond
drain
calibration
executed
Comprehensive Understanding of Hot Carrier Degradation in Multiple-fin SOI FinFETs
其他
2015-01-01
Jiang, Hai
;
Yin, Longxiang
;
Li, Yun
;
Xu, Nuo
;
Zhao, Kai
;
He, Yandong
;
Du, Gang
;
Liu, Xiaoyan
;
Zhang, Xing
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
multi-gate FET
Silicon-on-Insulator
hot carrier
interface charge
oxide charge
reliability
REGIME
©版权所有 ©2017 CSpace - Powered by
CSpace