CORC

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CORC

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Derivation of Pluripotent Stem Cells with In Vivo Embryonic and Extraembryonic Potency 其他
2017-01-01
Yang, Yang; Liu, Bei; Xu, Jun; Wang, Jinlin; Wu, Jun; Shi, Cheng; Xu, Yaxing; Dong, Jiebin; Wang, Chengyan; Lai, Weifeng; Zhu, Jialiang; Xiong, Liang; Zhu, Dicong; Li, Xiang; Yang, Weifeng; Yamauchi, Takayoshi; Sugawara, Atsushi; Li, Zhongwei; Sun, Fangyuan; Li, Xiangyun; Li, Chen; He, Aibin; Du, Yaqin; Wang, Ting; Zhao, Chaoran; Li, Haibo; Chi, Xiaochun; Zhang, Hongquan; Liu, Yifang; Li, Cheng; Duo, Shuguang; Yin, Ming; Shen, Huan; Belmonte, Juan Carlos Izpisua; Deng, Hongkui
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Simultaneous Reconstruction and Segmentation with the Mumford-Shah functional for Electron Tomography 其他
2016-01-01
Shen, Li; Quinto, Eric Todd; Wang, Shiqiang; Jiang, Ming
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ESD Reliability Evaluations of the 60-V nLDMOS by the Drain-side Discrete SCRs 其他
2016-01-01
Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
LDMOS  
Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
LDMOS  
ESD reliability improvement of the 0.25-��m 60-V power nLDMOS with discrete embedded SCRs separated by STI structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
ESD reliability evaluations of the 60-V nLDMOS by the drain-side discrete SCRs 其他
2016-01-01
Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
ESD-Reliability Characterizations of a 45-V p-Channel LDMOS-SCR with the Discrete-Cathode End 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03

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