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| An External Calibration Method for the Circular Scanning Device Used for Bend Tube Intelligent Inspection 会议论文 Changzhou, China, September 24-26,. 2021 作者: Zou HB(邹杭波); Xia RB(夏仁波); Zhao JB(赵吉宾); Zhang TY(张天宇); Chen YL(陈月玲)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:11/0  |  提交时间:2021/12/13
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| How Do People Read eBooks on Mobile Devices?: Implication for Digital Reading Environment Design 会议论文 作者: Wang, Xiaoguang; Cheng, Hanghang; Liu, Jing; Wang, Hongyu; Zhang, Chen
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:11/0  |  提交时间:2019/12/05 |
| BEOL Based RRAM with One Extra-mask for Low Cost, Highly Reliable Embedded Application in 28 nm Node and Beyond 会议论文 作者: Lv HB(吕杭炳) ; Xu XX(许晓欣) ; Yuan P(袁鹏); Dong DN(董大年) ; Gong TC(龚天成)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:26/0  |  提交时间:2018/07/26 |
| Current compliance impact on the instability of HfO2-based RRAM devices 会议论文 作者: Zhang MY(张美芸); Li Y(李阳) ; Liu Q(刘琦) ; Lv HB(吕杭炳) ; Liu M(刘明)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:16/0  |  提交时间:2017/05/19 |
| The Statistics of Set Time of Oxide-based Resistive Switching Memory 会议论文 作者: Zhang MY(张美芸); Wang GM(王国明); Yu ZA(余兆安) ; Li Y(李阳) ; Xu DL(许定林)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:22/0  |  提交时间:2017/05/19 |
| 锥形凹腔内冠齿喷嘴射流冲击换热研究 会议论文 2016年中国工程热物理学会传热传质学年会, 广州, 2016 作者: 关涛,张靖周,单勇,杭瑾
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:7/0  |  提交时间:2017/05/23 |
| Development of An Intelligent Interaction Service Robot Using ROS 会议论文 作者: Zhang Zhaohui; Mei Xuesong; Bian Xu; Cai Hanghang; Ti Jian
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:3/0  |  提交时间:2019/12/02
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| INVESTIGATION OF THE FORMING PROGRAM FAILTURE IN ITIR STRUCTURE 会议论文 作者: Liu M(刘明) ; Long SB(龙世兵) ; Wang GM(王国明); Zhang MY(张美芸); Liu HT(刘红涛)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:28/0  |  提交时间:2016/06/14 |
| Understanding of the abnormal unipolar resistance switching behavior in CBRAM 会议论文 作者: Liu M(刘明) ; Sun HT(孙海涛); Liu Q(刘琦) ; Xu DL(许定林); Zhang KK(张科科)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:10/0  |  提交时间:2016/06/14 |
| Justification and Monte Carlo simulation of microstructure evolution process of conductive filament in reset transition in Cu/HfO2/Pt RRAM 会议论文 作者: Liu Q(刘琦) ; Xu XX(许晓欣) ; Zhang MY(张美芸); Wang GM(王国明); Liu M(刘明)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:10/0  |  提交时间:2016/06/14 |