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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 发表日期：2019    专题：上海大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Early increase of neutrophil-to-lymphocyte ratio predicts 30-day mortality in patients with spontaneous intracerebral hemorrhage 期刊论文 CNS neuroscience & therapeutics, 2019, 卷号: 25, 页码: 30-35 作者:  Wang Fei[1];  Xu Feng[2];  Quan Ye[3];  Wang Li[4];  Xia Jian-Jun[5] 收藏  |  浏览/下载：63/0  |  提交时间：2019/04/22 inflammation  mortality  neutrophil-to-lymphocyte ratio  spontaneous intracerebral hemorrhage   Tuning spin reorientation in Er1-xYxFeO3 single crystal family 期刊论文 FRONTIERS OF PHYSICS, 2019, 卷号: 14 作者:  Yuan, Ning[1];  Li, Ru-Bin[2];  Yu, You-Shuang[3];  Feng, Zheng-Jie[4];  Kang, Bao-Juan[5] 收藏  |  浏览/下载：51/0  |  提交时间：2019/04/22 Er1-xYxFeO3  single crystal growth  magnetic measurements   Combustion synthesis of nontoxic water-induced InYO thin film and application in thin film transistor 期刊论文 MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2019, 卷号: 93, 页码: 201-207 作者:  Li, Jun[1];  Zhou, You-Hang[2];  Zhu, Wen-Qing[3];  Zhang, Jian-Hua[4];  Zhang, Zhi-Lin[5] 收藏  |  浏览/下载：24/0  |  提交时间：2019/04/22 Thin films  Amorphous materials  Sol-gel chemistry  Electrical properties   Discovery of TaFeSb-based half-Heuslers with high thermoelectric performance 期刊论文 NATURE COMMUNICATIONS, 2019, 卷号: 10 作者:  Zhu, Hangtian[1];  Mao, Jun[2];  Li, Yuwei[3];  Sun, Jifeng[4];  Wang, Yumei[5] 收藏  |  浏览/下载：39/0  |  提交时间：2019/04/22 Serum iron levels are an independent predictor of in-hospital mortality of critically ill patients: a retrospective, single-institution study 期刊论文 The Journal of international medical research, 2019, 卷号: 47, 页码: 66-75 作者:  Xia Jian-Jun[1];  Wang Fei[2];  Jiang Xiao-Nan[3];  Jiang Ting-Ting[4];  Shen Li-Juan[5] 收藏  |  浏览/下载：46/0  |  提交时间：2019/04/22 Critical illness  intensive care unit  mortality  prognosis  serum iron  survival analysis   Enhanced Stability of Sr-Doped Aqueous In2O3 Thin-Film Transistors Under Bias/Illumination/Thermal Stress 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 卷号: 66, 页码: 1308-1313 作者:  Zhou, You-Hang[1];  Li, Jun[2];  Zhong, De-Yao[3];  Li, Xi-Feng[4];  Zhang, Jian-Hua[5] 收藏  |  浏览/下载：15/0  |  提交时间：2019/04/22 Aqueous solutionmethod  oxygen-related defect  SrInO thin-film transistor (TFT)  stability