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	Enhanced Stability of Sr-Doped Aqueous In2O3 Thin-Film Transistors Under Bias/Illumination/Thermal Stress
	Zhou, You-Hang[1]; Li, Jun[2]; Zhong, De-Yao[3]; Li, Xi-Feng[4]; Zhang, Jian-Hua[5]
刊名	IEEE TRANSACTIONS ON ELECTRON DEVICES
	2019
卷号	66页码:1308-1313
关键词	Aqueous solutionmethod oxygen-related defect SrInO thin-film transistor (TFT) stability
ISSN号	0018-9383
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2161926
专题	上海大学
作者单位	1.[1]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China. 2.[2]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China. 3.[3]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China. 4.[4]Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. 5.[5]Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China.
推荐引用方式 GB/T 7714	Zhou, You-Hang[1],Li, Jun[2],Zhong, De-Yao[3],et al. Enhanced Stability of Sr-Doped Aqueous In2O3 Thin-Film Transistors Under Bias/Illumination/Thermal Stress[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES,2019,66:1308-1313.
APA	Zhou, You-Hang[1],Li, Jun[2],Zhong, De-Yao[3],Li, Xi-Feng[4],&Zhang, Jian-Hua[5].(2019).Enhanced Stability of Sr-Doped Aqueous In2O3 Thin-Film Transistors Under Bias/Illumination/Thermal Stress.IEEE TRANSACTIONS ON ELECTRON DEVICES,66,1308-1313.
MLA	Zhou, You-Hang[1],et al."Enhanced Stability of Sr-Doped Aqueous In2O3 Thin-Film Transistors Under Bias/Illumination/Thermal Stress".IEEE TRANSACTIONS ON ELECTRON DEVICES 66(2019):1308-1313.

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