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New threshold voltage shift model due to radiation in fully-depleted SOI MOSFET 期刊论文
tien tzu hsueh paoacta electronica sinica, 2001
Wan, Xin-Heng; Zhang, Xing; Tan, Jing-Rong; Gao, Wen-Yu; Huang, Ru; Wang, Yang-Yuan
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/17
Gate oxide reliability degradation by post polysilicon annealing and suppression method 期刊论文
pan tao ti hsueh paochinese journal of semiconductors, 2001
Gao, Wen-Yu; Liu, Zhong-Li; Yu, Fang; Zhang, Xing
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/17
Phenomenological MOSFET model including total dose radiation effects at a high total dose 期刊论文
pan tao ti hsueh paochinese journal of semiconductors, 2001
Wan, Xin-Heng; Zhang, Xing; Gao, Wen-Yu; Huang, Ru; Wang, Yang-Yuan
收藏  |  浏览/下载:1/0  |  提交时间:2015/11/17
Electrical characteristics of 3-6nm ultra-thin gate oxide 期刊论文
pan tao ti hsueh paochinese journal of semiconductors, 2001
Gao, Wen-Yu; Zhang, Xing; Tian, Da-Yu; Zhang, Da-Cheng; Wang, Yang-Yuan
收藏  |  浏览/下载:1/0  |  提交时间:2015/11/17


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