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Characterization of Silicon Wafers with Combined Photocarrier Radiometry and Free Carrier Absorption 期刊论文
INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2013, 卷号: 34, 期号: 8-9, 页码: 1735-1745
作者:  Li, Bincheng;  Huang, Qiuping;  Ren, Shengdong
收藏  |  浏览/下载:26/0  |  提交时间:2015/04/17
Optical and photo-carrier characterization of ultra-shallow junctions in silicon 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2013, 卷号: 56, 期号: 7, 页码: 1294-1300
作者:  Huang QiuPing;  Li BinCheng;  Ren ShengDong
收藏  |  浏览/下载:22/0  |  提交时间:2015/04/17
Optical and photo-carrier characterization of ultra-shallow junctions in silicon 期刊论文
Science China: Physics, Mechanics and Astronomy, 2013, 卷号: 56, 期号: 7, 页码: 1294-1300
作者:  Huang, Qiuping;  Li, Bincheng;  Ren, Shengdong
收藏  |  浏览/下载:11/0  |  提交时间:2016/11/21
Characterization of silicon wafers with combined photocarrier radiometry and free carrier absorption 期刊论文
International Journal of Thermophysics, 2013, 卷号: 34, 期号: 8-9, 页码: 1735-1745
作者:  Li, Bincheng;  Huang, Qiuping;  Ren, Shengdong
收藏  |  浏览/下载:14/0  |  提交时间:2016/11/21


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