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Single-Cell-Based Platform for Copy Number Variation Profiling through Digital Counting of Amplified Genomic DNA Fragments 期刊论文
ACS APPLIED MATERIALS & INTERFACES, 2017
Li, Chunmei; Yu, Zhilong; Fu, Yusi; Pang, Yuhong; Huang, Yanyi
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Thermal conductivity of suspended single crystal CH3NH3PbI3 platelets at room temperature 期刊论文
NANOSCALE, 2017
Shen, Chao; Du, Wenna; Wu, Zhiyong; Xing, Jun; Ha, Son Tung; Shang, Qiuyu; Xu, Weigao; Xiong, Qihua; Liu, Xinfeng; Zhang, Qing
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
A Wearable and Highly Sensitive Graphene Strain Sensor for Precise Home-Based Pulse Wave Monitoring 期刊论文
ACS SENSORS, 2017
Yang, Tingting; Jiang, Xin; Zhong, Yujia; Zhao, Xuanliang; Lin, Shuyuan; Li, Jing; Li, Xinming; Xu, Jianlong; Li, Zhihong; Zhu, Hongwei
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
RRAM-based parallel computing architecture using k-nearest neighbor classification for pattern recognition 期刊论文
SCIENTIFIC REPORTS, 2017
Jiang, Yuning; Kang, Jinfeng; Wang, Xinan
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Reliability evaluation of high-performance, low-power FinFET standard cells based on mixed RBB/FBB technique 期刊论文
Journal of Semiconductors, 2017
Wang Tian; Cui Xiaoxin; Ni Yewen; Liao Kai; Liao Nan; Yu Dunshan; Cui Xiaole
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Reliability evaluation of high-performance, low-power FinFET standard cells based on mixed RBB/FBB technique 期刊论文
半导体学报（英文版）, 2017
Tian Wang; Xiaoxin Cui; Yewen Ni; Kai Liao; Nan Liao; Dunshan Yu; Xiaole Cui
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Predictive compact modeling of random variations in FinFET technology for 16/14nm node and beyond 其他
2016-01-01
Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Band-inverted gaps in InAs/GaSb and GaSb/InAs core-shell nanowires 期刊论文
SCIENTIFIC REPORTS, 2016
Luo, Ning; Huang, Guang-Yao; Liao, Gaohua; Ye, Lin-Hui; Xu, H. Q.
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
A Novel PUF based on Cell Error Rate Distribution of STT-RAM 其他
2016-01-01
Zhang, Xian; Sun, Guangyu; Zhang, Yaojun; Chen, Yiran; Li, Hai; Wen, Wujie; Di, Jia
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
MEMORY  
A Device-Level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET Technology 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Jiang, Xiaobo; Guo, Shaofeng; Wang, Runsheng; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04

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