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	A Novel PUF based on Cell Error Rate Distribution of STT-RAM
	Zhang, Xian ; Sun, Guangyu ; Zhang, Yaojun ; Chen, Yiran ; Li, Hai ; Wen, Wujie ; Di, Jia
	2016
关键词	MEMORY
英文摘要	Physical Unclonable Functions (PUFs) have been widely proposed as security primitives to provide device identification and authentication. Recently, PUFs based on Non-volatile Memory (NVM) are widely proposed since the promise of NVMs' wide application. In addition, NVM-based PUFs are considered to be more immune to invasive attack and simulation attack than CMOS-based PUFs. However, the existing NVM-based PUF either shows the unreliability under environmental variations or need extra modifications to the IC manufacturing process. In this work, we propose err-PUF, a novel PUF design based on the cell error rate distribution of STT-RAM. Instead of using the distribution directly, we generate a stable fingerprint based on a novel concept called Error-rate Differential Pair (EDP) without modifications to the read/write circuits. Comprehensive results demonstrate that err-PUF can achieve sufficient reliability under environmental variations, which can significantly impact the cell error rates. Moreover, compared with existing approaches, err-PUF has a higher speed and lower power consumption with negligible overhead.; CPCI-S(ISTP); zhang.xian@pku.edu.cn; gsun@pku.edu.cn; yaz24@pitt.edu; yic52@pitt.edu; hal66@pitt.edu; wwen@fiu.edu; jdi@uark.edu; 342-347
语种	英语
出处	21st Asia and South Pacific Design Automation Conference (ASP-DAC)
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/460205]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Zhang, Xian,Sun, Guangyu,Zhang, Yaojun,et al. A Novel PUF based on Cell Error Rate Distribution of STT-RAM. 2016-01-01.

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