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科研机构
北京大学 [172]
内容类型
其他 [96]
期刊论文 [74]
会议论文 [2]
发表日期
2017 [12]
2016 [19]
2015 [23]
2014 [13]
2013 [13]
2012 [8]
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基于微型光电设备的典型靶标形状识别引导
期刊论文
兵工自动化, 2017
王洪
;
杜倩
;
晏磊
;
苗勇
;
柯子博
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
典型靶标
图像识别
微型光电设备
陀螺稳定
typical target
image recognition
miniature photoelectric device
gyro stabilization
Influence of Viscoelastic Underfill on Thermal Mechanical Reliability of a 3-D-TSV Stack by Simulation
期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2017
Zeng, Qinghua
;
Guan, Yong
;
Su, Fei
;
Chen, Jing
;
Jin, Yufeng
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
Microbump
thermal mechanical reliability
through-silicon-via
underfill
viscoelasticity
SOLDER
WARPAGE
FATIGUE
PACKAGE
To probe the performance of perovskite memory devices: defects property and hysteresis
期刊论文
JOURNAL OF MATERIALS CHEMISTRY C, 2017
Xu, Ziqi
;
Liu, Zonghao
;
Huang, Yuan
;
Zheng, Guanhaojie
;
Chen, Qi
;
Zhou, Huanping
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
RESISTIVE SWITCHING BEHAVIOR
TRANSITION-METAL OXIDES
SOLAR-CELLS
IODIDE
To probe the performance of perovskite memory device:defects property and hysteresis
会议论文
Ziqi Xu
;
Nengxu Li
;
Guanhaojie Zheng
;
Qi Chen
;
Huanping Zhou
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
perovskite
memory device
set voltage
trap density
hysteresis
perovskite
memory device
set voltage
trap density
hysteresis
Insights Into the Power-Off and Power-On Transient Performance of Power-Rail ESD Clamp Circuits
期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2017
Lu, Guangyi
;
Wang, Yuan
;
Wang, Yize
;
Zhang, Xing
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Electrostatic discharge (ESD)
ESD clamp circuit
transient response
soft failure
DESIGN
Oxygen Interstitial Creation in a-IGZO Thin-Film Transistors Under Positive Gate-Bias Stress
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Zhou, Xiaoliang
;
Shao, Yang
;
Zhang, Letao
;
Lu, Huiling
;
He, Hongyu
;
Han, Dedong
;
Wang, Yi
;
Zhang, Shengdong
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
Amorphous oxide semiconductor
thin-film transistors
reliability
positive gate-bias stress
defect creation
New Understanding of Random Telegraph Noise Amplitude in Tunnel FETs
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017
Chen, Cheng
;
Huang, Qianqian
;
Zhu, Jiadi
;
Zhao, Yang
;
Guo, Lingyi
;
Huang, Ru
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2017/12/03
Amplitude
annealing process
band-to-band tunneling (BTBT) generation rate
nonuniformity
random dopant fluctuation (RDF)
random telegraph noise (RTN)
source doping concentration
tunnel FET (TFET)
FIELD-EFFECT TRANSISTORS
RANDOM DOPANT FLUCTUATION
LINE-EDGE ROUGHNESS
1/F NOISE
ELECTRICAL NOISE
CMOS DEVICES
VARIABILITY
IMPACT
TFET
Attaining resistive switching characteristics and selector properties by varying forming polarities in a single HfO2-based RRAM device with a vanadium electrode
期刊论文
NANOSCALE, 2017
Lin, Chih-Yang
;
Chen, Po-Hsun
;
Chang, Ting-Chang
;
Chang, Kuan-Chang
;
Zhang, Sheng-Dong
;
Tsai, Tsung-Ming
;
Pan, Chih-Hung
;
Chen, Min-Chen
;
Su, Yu-Ting
;
Tseng, Yi-Ting
;
Chang, Yao-Feng
;
Chen, Ying-Chen
;
Huang, Hui-Chun
;
Sze, Simon M.
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
METAL-INSULATOR-TRANSITION
MEMORY
OXIDES
NANOCROSSBAR
RERAM
The Impact of Self-Heating on HCI Reliability in High-Performance Digital Circuits
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Jiang, Hai
;
Shin, SangHoon
;
Liu, Xiaoyan
;
Zhang, Xing
;
Alam, Muhammad Ashraful
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Self-heating
digital circuits
hot carrier injection
reliability
lifetime
MOSFETS
Pseudo-Differential Sensing Framework for STT-MRAM: A Cross-Layer Perspective
期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2017
Kang, Wang
;
Chang, Liang
;
Wang, Zhaohao
;
Lv, Weifeng
;
Sun, Guanyu
;
Zhao, Weisheng
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Asymmetric sensing
dynamic write power
read reliability
STT-MRAM
MEMORY
CIRCUIT
BENCHMARKING
PERFORMANCE
TECHNOLOGY
DEVICES
STORAGE
DESIGN
CACHES
ENERGY
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