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| K2O及其类似氧化物的第一性原理计算 期刊论文 科技通报, 2017 聂淑芳; 苏星瑶; 王洋; 姜源; 吴圣; 赵习; 蒋启财
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:56/0  |  提交时间:2017/12/03
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| Novel through-silicon vias for enhanced signal integrity in 3D integrated systems 期刊论文 Journal of Semiconductors, 2016 方孺牛; 孙新; 缪旻; 金玉丰
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
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| Novel through-silicon vias for enhanced signal integrity in 3D integrated systems 期刊论文 半导体学报(英文版), 2016 Fang Runiu; Sun Xin; Miao Min; Jin Yufeng
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
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| Efficient Color-to-Gray Conversion for Digital Images in Gradient Domain 其他 2015-01-01 Zheng, Xiuyu; Feng, Jie; Zhou, Bingfeng
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
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| Well-posedness in energy space for the periodic modified Benjamin-Ono equation 其他 2014-01-01 Guo, Zihua; Lin, Yiquan; Molinet, Luc
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10
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| Simulation of an Diode by Using Globally-Hyperbolically-Closed High-Order Moment Models 其他 2014-01-01 Hu, Zhicheng; Li, Ruo; Lu, Tiao; Wang, Yanli; Yao, Wenqi
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:4/0  |  提交时间:2015/11/10
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| Accuracy and efficiency in computing electrostatic potential for an ion channel model in layered dielectric/electrolyte media 其他 2014-01-01 Lin, Huimin; Tang, Huazhong; Cai, Wei
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:7/0  |  提交时间:2015/11/10
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| Numerical comparison of three stochastic methods for nonlinear PN junction problems 其他 2014-01-01 Yao, Wenqi; Lu, Tiao
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
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| An analytic model for gate-all-around silicon nanowire tunneling field effect transistors 期刊论文 chinese physics b, 2014 Liu Ying; He Jin; Chan Mansun; Du Cai-Xia; Ye Yun; Zhao Wei; Wu Wen; Deng Wan-Ling; Wang Wen-Ping
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:4/0  |  提交时间:2015/11/11
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| Remote charge scattering: a full Coulomb interaction approach and its impact on silicon nMOS FinFETs with HfO2 gate dielectric 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2014 Wei KangLiang; Egley, James; Liu XiaoYan; Du Gang
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
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