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科研机构
北京大学 [17]
内容类型
期刊论文 [14]
其他 [3]
发表日期
2017 [2]
2016 [3]
2015 [4]
2014 [6]
2013 [2]
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专题:北京大学
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Source-drain resistance characteristics of back-channel etched amorphous InGaZnO thin film transistors with TiO2:Nb protective layer
期刊论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2017
Zhang, Letao
;
Zhou, Xiaoliang
;
Chang, Baozhu
;
Wang, Longyan
;
Xiao, Yuxiang
;
He, Hongyu
;
Zhang, Shengdong
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2017/12/03
Amorphous indium gallium zinc oxide
Thin film transistors
Source-drain parasitic resistance
TiO2:Nb
Films thickness
THRESHOLD VOLTAGE
ANATASE TIO2
PERFORMANCE
SHIFT
TFTS
Nb Doped TiO2 Protected Back-Channel-Etched Amorphous InGaZnO Thin Film Transistors
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Zhang, Letao
;
Zhou, Xiaoliang
;
Yang, Huan
;
He, Hongyu
;
Wang, Longyan
;
Zhang, Min
;
Zhang, Shengdong
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Amorphous indium gallium zinc oxide (a-IGZO)
thin film transistors (TFTs)
back-channel-etch (BCE) process
Nb doped TiO2
THRESHOLD VOLTAGE
CARBON-NANOFILM
BARRIER LAYER
PERFORMANCE
SHIFT
A Back-Channel-Etched Amorphous InGaZnO Thin-Film Transistor Technology With Al-Doped ZnO as Source/Drain and Pixel Electrodes
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
Deng, Wei
;
Xiao, Xiang
;
Shao, Yang
;
Song, Zhen
;
Lee, Chia-Yu
;
Lien, Alan
;
Zhang, Shengdong
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Aluminum-doped ZnO (AZO)
amorphous indium-gallium-zinc oxide (a-IGZO)
back-channel-etch (BCE)
pixel electrode (PE)
thin-film transistor (TFT)
wet etch
THRESHOLD VOLTAGE
PERFORMANCE
DAMAGE
LAYER
TFTS
SIO2
Investigation into sand mura effects of a-IGZO TFT LCDs
期刊论文
MICROELECTRONICS RELIABILITY, 2016
Liu, Xiang
;
Hu, Hehe
;
Ning, Ce
;
Shang, Guangliang
;
Yang, Wei
;
Wang, Ke
;
Lu, Xinhong
;
Lee, Woobong
;
Wang, Gang
;
Xue, Jianshe
;
Jun, Jung Mok
;
Zhang, Shengdong
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
a-IGZO TFTs
LCD reliability test
Sand mura
Threshold voltage shift
Positive
Thermal gate bias stress
THIN-FILM TRANSISTORS
High reliability of IGZO TFTs using low-temperature fabricated organic passivation layers
其他
2016-01-01
Huiling Lu
;
Ting Liang
;
Shengdong Zhang
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
swing
degraded
resist
indium
amorphous
remarkably
sputtering
annealing
candidate
magnetron
swing
degraded
resist
indium
amorphous
remarkably
sputtering
annealing
candidate
magnetron
Back Channel Anodization Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors Process
期刊论文
ieee electron device letters, 2015
Xiao, Xiang
;
Shao, Yang
;
He, Xin
;
Deng, Wei
;
Zhang, Letao
;
Zhang, Shengdong
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/11
Amorphous indium gallium zinc oxide (a-IGZO)
thin-film transistors (TFTs)
back channel anodization (BCA)
low temperature
Performance and Stability Improvements of Back-Channel-Etched Amorphous Indium-Gallium-Zinc Thin-Film-Transistors by CF4+O-2 Plasma Treatment
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2015
Liu, Xiang
;
Wang, Lisa Ling
;
Hu, Hehe
;
Lu, Xinhong
;
Wang, Ke
;
Wang, Gang
;
Zhang, Shengdong
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
a-IGZO TFTs
back-channel-etch (BCE)
plasma treatment
threshold voltage shift
THRESHOLD VOLTAGE
SHIFT
OXIDE
GATE
Comparative study of a-IGZO TFTs with direct current and radio frequency sputtered channel layers
期刊论文
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2015
Deng, Wei
;
Xiao, Xiang
;
He, Xin
;
Lee, Chia-Yu
;
Zhang, Shengdong
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
amorphous indium-gallium-zinc oxide (a-IGZO)
RF sputtering
DC sputtering
oxygen vacancy
stability
THIN-FILM TRANSISTORS
TRANSPORT
Low-Voltage a-InGaZnO Thin-Film Transistors With Anodized Thin HfO2 Gate Dielectric
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2015
Shao, Yang
;
Xiao, Xiang
;
He, Xin
;
Deng, Wei
;
Zhang, Shengdong
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Amorphous indium-gallium-zinc oxide (a-IGZO)
anodized HfO2
high-k
low voltage
thin-film transistors (TFTs)
OXIDE
TEMPERATURE
ALUMINUM
Gate Bias Stress-Induced Threshold Voltage Shift Effect of a-IGZO TFTs with Cu Gate
期刊论文
ieee电子器件汇刊, 2014
Liu, Xiang
;
Wang, Lisa Ling
;
Ning, Ce
;
Hu, Hehe
;
Yang, Wei
;
Wang, Ke
;
Yoo, Seong Yeol
;
Zhang, Shengdong
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/10
Amorphous indium gallium zinc oxide thin-film transistors (a-IGZO TFTs)
copper diffusion
copper gate
stacked gate insulator
threshold voltage shift
THIN-FILM TRANSISTORS
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