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Thickness measurement of GaN films by X-ray diffraction 期刊论文
2010, 2010
Li Hong-Tao; Luo Yi; Xi Guang-Yi; Wang Lai; Jiang Yang; Zhao Wei; Han Yan-Jun; Hao Zhi-Biao; Sun Chang-Zheng
收藏  |  浏览/下载:4/0
Deposition and characterization of AlN thin films on silicon 期刊论文
2010, 2010
Yu Yi; Ren Tianling; Liu Litian
收藏  |  浏览/下载:2/0


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