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Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films 期刊论文
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 卷号: 76, 期号: 1
作者:  Xiong, R;  Li, ZY;  Yang, XF;  Peng, ZL;  Wang, K
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/05
Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films 期刊论文
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 卷号: 76, 期号: 1
作者:  Xiong, R;  Li, ZY;  Yang, XF;  Peng, ZL;  Wang, K
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/05


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