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	Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films
	Xiong, R; Li, ZY; Yang, XF; Peng, ZL; Wang, K; Tian, DC
刊名	MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
	2000
卷号	76期号:1
关键词	dielectric tensor magnetic film magneto-optic effect rotation angle reflectivity
ISSN号	0921-5107
DOI	10.1016/S0921-5107(00)00398-6
URL标识	查看原文
收录类别	SCIE ; CPCI-S
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4252581
专题	武汉大学
推荐引用方式 GB/T 7714	Xiong, R,Li, ZY,Yang, XF,et al. Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films[J]. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,2000,76(1).
APA	Xiong, R,Li, ZY,Yang, XF,Peng, ZL,Wang, K,&Tian, DC.(2000).Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films.MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,76(1).
MLA	Xiong, R,et al."Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films".MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 76.1(2000).

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