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CORC

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Low-dose, high-resolution and high-efficiency ptychography at STXM beamline of SSRF 会议论文
Diamond Light Source, Oxford, ENGLAND, AUG 15-19, 2016
作者:  Xu, ZJ;  Wang, CP;  Liu, HG;  Tao, XL;  Tai, RZ
收藏  |  浏览/下载：10/0  |  提交时间：2019/12/31
A two-step synthesis of NaTaO3 microspheres for photocatalytic water splitting 会议论文
Li, Yingxuan (1); Gou, Huange (2); Lu, Jianjiang (2); Wang, Chuanyi (1)
收藏  |  浏览/下载：14/0  |  提交时间：2014/11/10
Design of the real-time autofocusing system for collimator with long focus length and large aperture (EI CONFERENCE) 会议论文
2011 International Academic Conference on Numbers, Intelligence, Manufacturing Technology and Machinery Automation, MAMT 2011, December 24, 2011 - December 25, 2011, Wuhan, China
Li X.; Zhang X.
收藏  |  浏览/下载：34/0  |  提交时间：2013/03/25
Large aperture collimator which has been widely used for calibrating and testing various optical devices plays an essential role in correlative laboratories. As being the basic testing and calibration equipment  the large aperture collimator's accuracy should be much higher than the device under testing in order to ensure the accuracy of the measurement. However  the process of adjusting the collimator is extremely complicated due to the collimator's large aperture and long focal length. So it is difficult to ensure the measurement's quality and easy to cause the system being vulnerable to the surrounding environment. One of the most common problems is defocus. In order to solve the problem above  this issue presents a new type of autocollimator autofocusing system which uses pentaprism instead of using large-aperture plane mirror  semiconductor lasers as light source and CCD sensor as receiver. The system is smaller  lighter  and more convenient when using. The computer simulation shows that the autofocusing system's resolution could reach the accuracy of 40m. If we use the relevant algorithms to execute the sub-pixel scanning  the resolution could reach the accuracy of 10m. It shows that the system could satisfy the required testing precision of testing large aperture optical device.  
Error analysis of frequency mixing on heterodyne interferometry detecting device for superfinish surface scratch 会议论文
Proceedings of the SPIE - The International Society for Optical Engineering, Ninth International Symposium on Laser Metrology, Singapore, Singapore, INSPEC
Haoshan Lin; Yuhe Li; Dongsheng Wang; Mei Liu
收藏  |  浏览/下载：6/0
Optical mammographer with single channel detection 会议论文
Medical Imaging 2005: Visualization, Image-Guided Procedures, and Display, Pts 1 and 2, Medical Imaging 2005 Conference, San Diego, CA, Web of Science, INSPEC
Fan, XF; Zhang, YH; Bai, J; Gao, TX
收藏  |  浏览/下载：4/0
Error Analysis of Frequency Mixing on Heterodyne Interferometry Detecting Device for Superfinish Surface Scratch - art. no. 71552P 会议论文
NINTH INTERNATIONAL SYMPOSIUM ON LASER METROLOGY, PTS 1 AND 2, 9th International Symposium on Laser Metrology, Singapore, SINGAPORE, Web of Science
Lin, Haoshan; Li, Yuhe; Wang, Dongsheng; Liu, Mei
收藏  |  浏览/下载：4/0
High-performance soft x-ray spectromicroscopy beamline at SSRF (EI CONFERENCE) 会议论文
Xue C.; Wang Y.; Guo Z.; Wu Y.; Zhen X.; Chen M.; Chen J.; Xue S.; Peng Z.; Lu Q.; Tai R.
收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25
High-efficiency GaN-based blue LEDs grown on nano-patterned sapphire substrates for solid-state lighting - art. no. 684103 会议论文
conference on solid state lighting and solar energy technologies, beijing, peoples r china, nov 12-14, 2007
Yan, FW; Gao, HY; Zhang, Y; Li, JM; Zeng, YP; Wang, GH; Yang, FH
收藏  |  浏览/下载：134/0  |  提交时间：2010/03/09
GaN  MOCVD  LED  nano-pattern  SEM  HRXRD  PL  
High-brightness GaN-based blue LEDs grown on a wet-patterned sapphire substrate - art. no. 68410T 会议论文
conference on solid state lighting and solar energy technologies, beijing, peoples r china, nov 12-14, 2007
Zhang, Y; Yan, FW; Gao, HY; Li, JM; Zeng, YP; Wang, GH; Yang, FH
收藏  |  浏览/下载：35/0  |  提交时间：2010/03/09
The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE) 会议论文
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China
Wu X.; Lei F.; Yatagai T.
收藏  |  浏览/下载：11/0  |  提交时间：2013/03/25

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