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Reduced perssure-chemical vapor deposition of high quality Ge layers on SiGe/Si superlayers for microelectronics and optoelectronics purposes 会议论文
4th International Symposium on Graphene, Ge/III-V and Emerging Materials for Post-CMOS Applications - 221st ECS Meeting, Seattle, WA, United states, May 6, 2012 - May 10, 2012
作者:  Chen, Da;  Xue, Zhongying;  Liu, Su;  Zhang, Miao
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