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Characterization of arsenic ultra-shallow junctions in silicon using photocarrier radiometry and spectroscopic ellipsometry 会议论文
International Journal of Thermophysics, 2012
作者:  Huang, Qiuping;  Li, Bincheng;  Gao, Weidong
收藏  |  浏览/下载:11/0  |  提交时间:2016/11/25
Characterization of hafnia thin films made with different deposition technologies 会议论文
Proc. of SPIE, 2011
作者:  Wanjun Ai;  Shengming Xiong
收藏  |  浏览/下载:8/0  |  提交时间:2016/11/25


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