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浏览/检索结果: 共1条，第1-1条 帮助 限定条件 内容类型：会议论文    专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE) 会议论文 6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China Yang P.; Ai H. 收藏  |  浏览/下载：18/0  |  提交时间：2013/03/25 Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules  allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity  polarization  phase plate  primary aberrations  STED pulse shape  pulse duration and delay time. In this paper  we found related models and simulate the relationship between the depletion patterns and the parameters  and put forward effective approach to enhance the system resolution. 2010 SPIE.