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SEU tolerance improvement in 22 nm UTBB FDSOI SRAM based on a simple 8T hardened cell 期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 100, 页码: 6
作者:  Cai, C.;  Zhao, P. X.;  Xu, L. W.;  Liu, T. Q.;  Li, D. Q.
收藏  |  浏览/下载:25/0  |  提交时间:2022/01/19
Total Ionizing Dose Influence on the Single-Event Multiple-Cell Upsets in 65-nm 6-T SRAM 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 6, 页码: 892-898
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载:80/0  |  提交时间:2019/11/10
A genome-wide view of mutations in respiration-deficient mutants of Saccharomyces cerevisiae selected following carbon ion beam irradiation 期刊论文
APPLIED MICROBIOLOGY AND BIOTECHNOLOGY, 2019, 卷号: 103, 页码: 1851-1864
作者:  Guo, Xiaopeng;  Zhang, Miaomiao;  Gao, Yue;  Cao, Guozhen;  Yang, Yang
收藏  |  浏览/下载:71/0  |  提交时间:2019/04/02


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