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浏览/检索结果: 共23条，第1-10条 帮助 限定条件 发表日期：2015    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Investigation of the synaptic device based on the resistive switching behavior in hafnium oxide 期刊论文 progress in natural science materials international, 2015 Gao, Bin; Liu, Lifeng; Kang, Jinfeng 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 Hafnium oxide (HfOx)  Resistive switching  Memristor  Multilevel cell (MLC)  Synapse  SYSTEMS  MEMORY   Design and modeling of a continuously variable piezoelectric RF MEMS switch 期刊论文 microsystem technologies, 2015 Giffney, Tim; Aw, Kean; Yu, Miao; Gao, Wei; Zhang, Haixia 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/12 Accelerated Aging in Analog and Digital Circuits With Feedback 期刊论文 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015 Sutaria, Ketul B.; Mohanty, Abinash; Wang, Runsheng; Huang, Ru; Cao, Yu 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Circuit aging  bias runaway  BTI  CHC  DVS  aging models and simulation framework  BIAS TEMPERATURE INSTABILITY  HOT-CARRIER DEGRADATION  DEEP-SUBMICRON NMOSFETS  E-E SCATTERING  NBTI  RELIABILITY  SIMULATION  DESIGN  CROSS  MODEL   Comprehensive Understanding of Hot Carrier Degradation in Multiple-fin SOI FinFETs 其他 2015-01-01 Jiang, Hai; Yin, Longxiang; Li, Yun; Xu, Nuo; Zhao, Kai; He, Yandong; Du, Gang; Liu, Xiaoyan; Zhang, Xing 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 multi-gate FET  Silicon-on-Insulator  hot carrier  interface charge  oxide charge  reliability  REGIME   Variation-aware energy-delay optimization method for device/circuit co-design 其他 2015-01-01 Wang, Junyao; Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Wei, Lan; Huang, Ru 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Flexible solar cells based on graphene-ultrathin silicon Schottky junction 期刊论文 RSC ADVANCES, 2015 Jiao, Tianpeng; Wei, Dapeng; Liu, Jian; Sun, Wentao; Jia, Shuming; Zhang, Wei; Feng, Yanhui; Shi, Haofei; Du, Chunlei 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 COPPER FOILS  EFFICIENCY  FILMS  PROGRESS  LAYERS  DIODE   Design of an auto-removing mechanism based on a PLC control system 其他 2015-01-01 Zhang, Xinrui; Ju, Hui; Guo, Dequan; Liu, Richen 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 3-D Resistive Memory Arrays: From Intrinsic Switching Behaviors to Optimization Guidelines 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015 Li, Haitong; Gao, Bin; Chen, Hong-Yu; Chen, Zhe; Huang, Peng; Liu, Rui; Zhao, Liang; Jiang, Zizhen; Liu, Lifeng; Liu, Xiaoyan; Yu, Shimeng; Kang, Jinfeng; Nishi, Yoshi; Wong, H.S. Philip 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 3-D array  optimization  reliability  resistive random access memory (RRAM)  variability  RANDOM-ACCESS MEMORY  METAL-OXIDE RRAM  DEVICES  MODEL  SIMULATION   Nonvolatile Logic and In Situ Data Transfer Demonstrated in Crossbar Resistive RAM Array 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2015 Li, Haitong; Chen, Zhe; Ma, Wenjia; Gao, Bin; Huang, Peng; Liu, Lifeng; Liu, Xiaoyan; Kang, Jinfeng 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Resistive random access memory (RRAM)  nonvolatile logic  communication  crossbar array  STATEFUL LOGIC  ATOMIC SWITCH  MEMORY  DEVICES   New Assessment Methodology Based on Energy-Delay-Yield Cooptimization for Nanoscale CMOS Technology 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015 Jiang, Xiaobo; Wang, Junyao; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Wei, Lan; Huang, Ru 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Delay  energy  optimization  reliability  variability  yield  LINEWIDTH ROUGHNESS LWR  VARIABILITY  DEVICES  REQUIREMENTS  OPTIMIZATION  PERFORMANCE  LER  NM