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Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part I-Modeling and Simulation Method 期刊论文
ieee电子器件汇刊, 2013
Jiang, Xiaobo; Wang, Runsheng; Yu, Tao; Chen, Jiang; Huang, Ru
收藏  |  浏览/下载:11/0  |  提交时间:2015/11/10
Wetting behavior and interfacial characteristic of the Sn-3.5Ag alloy on Ni substrates 会议论文
Zang, Li Kun; Yan, Hong Liang; Yuan, Zhang Fu; Lu, Li Ying
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/17
Continuum description for the characteristic resistance sensed by a cylinder colliding against granular medium 期刊论文
science china physics mechanics astronomy, 2013
Pang Yong; Liu CaiShan
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/10
Dissolutive wetting process and interfacial characteristic of molten Sn-17Bi-0.5Cu alloy on copper substrate 期刊论文
稀有金属, 2013
Xu, Bing-Sheng; Zang, Li-Kun; Yuan, Zhang-Fu; Wu, Yan; Zhou, Zhou
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10


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