×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
长春光学精密机械与物... [1]
内容类型
会议论文 [1]
发表日期
2011 [1]
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共1条,第1-1条
帮助
限定条件
发表日期:2011
专题:长春光学精密机械与物理研究所
第一署名单位
第一作者单位
通讯作者单位
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE)
会议论文
MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China
Wang X.-J.
;
Li X.-Z.
;
Su S.-C.
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2013/03/25
A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper
we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case
we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values
the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore
we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.
©版权所有 ©2017 CSpace - Powered by
CSpace