CORC  > 湖南大学
New approach for fast fault diagnosis of large-scale analogue circuits.
QI Bei; HE Yi-gang; FANG Ge-feng; FAN Xiao-teng
刊名Application Research of Computers / Jisuanji Yingyong Yanjiu
2013
卷号Vol.30 No.11页码:3302-3305
关键词DEBUGGING in computer science LARGE scale systems ELECTRIC circuits PROBLEM solving ELECTRIC fault location COMPLEX analysis (Mathematics) EIGENVECTORS PATTERN recognition systems
URL标识查看原文
公开日期[db:dc_date_available]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/6497641
专题湖南大学
作者单位1.College of Electrical & Information Engineering, Hunan University, Changsha 410082, China
2.China National Key Laboratory of Science & Technology on Electronic Test & Measurement, 41st Research Institute of China Electronics Technology Croup Corporation, Qingdao Shandong 266555, China
推荐引用方式
GB/T 7714
QI Bei,HE Yi-gang,FANG Ge-feng,et al. New approach for fast fault diagnosis of large-scale analogue circuits.[J]. Application Research of Computers / Jisuanji Yingyong Yanjiu,2013,Vol.30 No.11:3302-3305.
APA QI Bei,HE Yi-gang,FANG Ge-feng,&FAN Xiao-teng.(2013).New approach for fast fault diagnosis of large-scale analogue circuits..Application Research of Computers / Jisuanji Yingyong Yanjiu,Vol.30 No.11,3302-3305.
MLA QI Bei,et al."New approach for fast fault diagnosis of large-scale analogue circuits.".Application Research of Computers / Jisuanji Yingyong Yanjiu Vol.30 No.11(2013):3302-3305.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace