New approach for fast fault diagnosis of large-scale analogue circuits. | |
QI Bei; HE Yi-gang; FANG Ge-feng; FAN Xiao-teng | |
刊名 | Application Research of Computers / Jisuanji Yingyong Yanjiu |
2013 | |
卷号 | Vol.30 No.11页码:3302-3305 |
关键词 | DEBUGGING in computer science LARGE scale systems ELECTRIC circuits PROBLEM solving ELECTRIC fault location COMPLEX analysis (Mathematics) EIGENVECTORS PATTERN recognition systems |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6497641 |
专题 | 湖南大学 |
作者单位 | 1.College of Electrical & Information Engineering, Hunan University, Changsha 410082, China 2.China National Key Laboratory of Science & Technology on Electronic Test & Measurement, 41st Research Institute of China Electronics Technology Croup Corporation, Qingdao Shandong 266555, China |
推荐引用方式 GB/T 7714 | QI Bei,HE Yi-gang,FANG Ge-feng,et al. New approach for fast fault diagnosis of large-scale analogue circuits.[J]. Application Research of Computers / Jisuanji Yingyong Yanjiu,2013,Vol.30 No.11:3302-3305. |
APA | QI Bei,HE Yi-gang,FANG Ge-feng,&FAN Xiao-teng.(2013).New approach for fast fault diagnosis of large-scale analogue circuits..Application Research of Computers / Jisuanji Yingyong Yanjiu,Vol.30 No.11,3302-3305. |
MLA | QI Bei,et al."New approach for fast fault diagnosis of large-scale analogue circuits.".Application Research of Computers / Jisuanji Yingyong Yanjiu Vol.30 No.11(2013):3302-3305. |
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