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	Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action
	Shen, J.; Shahid, I; Yu, X.; Zhang, J.; Zhong, H. W.; Huang, W. Y.; Liang, G. Y.; Cui, X. J.; Yan, S.; Zhang, X. F.
刊名	LASER AND PARTICLE BEAMS
	2018
卷号	36页码:129-135
关键词	Compressed plasma flow finite element method fracture mechanics J integral single-crystal silicon
ISSN号	0263-0346
DOI	10.1017/S026303461800006X
URL标识	查看原文
收录类别	SCIE
WOS记录号	WOS:000430473600018
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5934400
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Shen, J.,Shahid, I,Yu, X.,et al. Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action[J]. LASER AND PARTICLE BEAMS,2018,36:129-135.
APA	Shen, J..,Shahid, I.,Yu, X..,Zhang, J..,Zhong, H. W..,...&Le, X. Y..(2018).Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action.LASER AND PARTICLE BEAMS,36,129-135.
MLA	Shen, J.,et al."Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action".LASER AND PARTICLE BEAMS 36(2018):129-135.

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