Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action | |
Shen, J.; Shahid, I; Yu, X.; Zhang, J.; Zhong, H. W.; Huang, W. Y.; Liang, G. Y.; Cui, X. J.; Yan, S.; Zhang, X. F. | |
刊名 | LASER AND PARTICLE BEAMS |
2018 | |
卷号 | 36页码:129-135 |
关键词 | Compressed plasma flow finite element method fracture mechanics J integral single-crystal silicon |
ISSN号 | 0263-0346 |
DOI | 10.1017/S026303461800006X |
URL标识 | 查看原文 |
收录类别 | SCIE |
WOS记录号 | WOS:000430473600018 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5934400 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Shen, J.,Shahid, I,Yu, X.,et al. Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action[J]. LASER AND PARTICLE BEAMS,2018,36:129-135. |
APA | Shen, J..,Shahid, I.,Yu, X..,Zhang, J..,Zhong, H. W..,...&Le, X. Y..(2018).Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action.LASER AND PARTICLE BEAMS,36,129-135. |
MLA | Shen, J.,et al."Surface exfoliation analysis on single-crystal silicon under compressed plasma flow action".LASER AND PARTICLE BEAMS 36(2018):129-135. |
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