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	Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors
	Hao Songhua; Jun, Yang; Berenguer, Christophe
刊名	RELIABILITY ENGINEERING & SYSTEM SAFETY
	2019
卷号	189页码:261-270
关键词	Extended inverse Gaussian process model Skew-normal random effects Measurement errors The MLE method Extended MC integration algorithm
ISSN号	0951-8320
DOI	10.1016/j.ress.2019.04.031
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000474493000021
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5920385
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Hao Songhua,Jun, Yang,Berenguer, Christophe. Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors[J]. RELIABILITY ENGINEERING & SYSTEM SAFETY,2019,189:261-270.
APA	Hao Songhua,Jun, Yang,&Berenguer, Christophe.(2019).Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors.RELIABILITY ENGINEERING & SYSTEM SAFETY,189,261-270.
MLA	Hao Songhua,et al."Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors".RELIABILITY ENGINEERING & SYSTEM SAFETY 189(2019):261-270.

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