Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors | |
Hao Songhua; Jun, Yang; Berenguer, Christophe | |
刊名 | RELIABILITY ENGINEERING & SYSTEM SAFETY |
2019 | |
卷号 | 189页码:261-270 |
关键词 | Extended inverse Gaussian process model Skew-normal random effects Measurement errors The MLE method Extended MC integration algorithm |
ISSN号 | 0951-8320 |
DOI | 10.1016/j.ress.2019.04.031 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI |
WOS记录号 | WOS:000474493000021 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5920385 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Hao Songhua,Jun, Yang,Berenguer, Christophe. Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors[J]. RELIABILITY ENGINEERING & SYSTEM SAFETY,2019,189:261-270. |
APA | Hao Songhua,Jun, Yang,&Berenguer, Christophe.(2019).Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors.RELIABILITY ENGINEERING & SYSTEM SAFETY,189,261-270. |
MLA | Hao Songhua,et al."Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors".RELIABILITY ENGINEERING & SYSTEM SAFETY 189(2019):261-270. |
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