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	An improved SIFT image tamper forensics method
	Huang, Huifen; He, Yonghui; Liu, Qingmin
刊名	International Journal of Circuits, Systems and Signal Processing
	2018
卷号	12页码:143-146
关键词	Copy-move processing SIFT matching Tamper forensics
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4569086
专题	山东大学
作者单位	1.Shandong University, School of Information Engineering, Jinan 2.Shandong 3.250101, China 4.Shandong University, School of
推荐引用方式 GB/T 7714	Huang, Huifen,He, Yonghui,Liu, Qingmin. An improved SIFT image tamper forensics method[J]. International Journal of Circuits, Systems and Signal Processing,2018,12:143-146.
APA	Huang, Huifen,He, Yonghui,&Liu, Qingmin.(2018).An improved SIFT image tamper forensics method.International Journal of Circuits, Systems and Signal Processing,12,143-146.
MLA	Huang, Huifen,et al."An improved SIFT image tamper forensics method".International Journal of Circuits, Systems and Signal Processing 12(2018):143-146.

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