An improved SIFT image tamper forensics method | |
Huang, Huifen; He, Yonghui; Liu, Qingmin | |
刊名 | International Journal of Circuits, Systems and Signal Processing
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2018 | |
卷号 | 12页码:143-146 |
关键词 | Copy-move processing SIFT matching Tamper forensics |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4569086 |
专题 | 山东大学 |
作者单位 | 1.Shandong University, School of Information Engineering, Jinan 2.Shandong 3.250101, China 4.Shandong University, School of |
推荐引用方式 GB/T 7714 | Huang, Huifen,He, Yonghui,Liu, Qingmin. An improved SIFT image tamper forensics method[J]. International Journal of Circuits, Systems and Signal Processing,2018,12:143-146. |
APA | Huang, Huifen,He, Yonghui,&Liu, Qingmin.(2018).An improved SIFT image tamper forensics method.International Journal of Circuits, Systems and Signal Processing,12,143-146. |
MLA | Huang, Huifen,et al."An improved SIFT image tamper forensics method".International Journal of Circuits, Systems and Signal Processing 12(2018):143-146. |
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