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	Simulation and optimization of capacitance sensor based on orthogonal test
	Wang, Xiaoxin; Yan, Jiebing; Hu, Hongli; Gao, Xiangxiang; Zhang, Xiao
刊名	Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University
	2013
卷号	47期号:[db:dc_citation_issue]页码:81-86
关键词	Capacitance sensors Electrode number Optimum combination Orthogonal experiment Orthogonal test Sensing fields Sensitivity distributions Sensitivity measurement Simulation and optimization Static tests Variance analysis
ISSN号	0253-987X
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4437776
专题	西安交通大学
推荐引用方式 GB/T 7714	Wang, Xiaoxin,Yan, Jiebing,Hu, Hongli,et al. Simulation and optimization of capacitance sensor based on orthogonal test[J]. Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University,2013,47([db:dc_citation_issue]):81-86.
APA	Wang, Xiaoxin,Yan, Jiebing,Hu, Hongli,Gao, Xiangxiang,&Zhang, Xiao.(2013).Simulation and optimization of capacitance sensor based on orthogonal test.Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University,47([db:dc_citation_issue]),81-86.
MLA	Wang, Xiaoxin,et al."Simulation and optimization of capacitance sensor based on orthogonal test".Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University 47.[db:dc_citation_issue](2013):81-86.

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