Simulation and optimization of capacitance sensor based on orthogonal test | |
Wang, Xiaoxin; Yan, Jiebing; Hu, Hongli; Gao, Xiangxiang; Zhang, Xiao | |
刊名 | Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University |
2013 | |
卷号 | 47期号:[db:dc_citation_issue]页码:81-86 |
关键词 | Capacitance sensors Electrode number Optimum combination Orthogonal experiment Orthogonal test Sensing fields Sensitivity distributions Sensitivity measurement Simulation and optimization Static tests Variance analysis |
ISSN号 | 0253-987X |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4437776 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Wang, Xiaoxin,Yan, Jiebing,Hu, Hongli,et al. Simulation and optimization of capacitance sensor based on orthogonal test[J]. Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University,2013,47([db:dc_citation_issue]):81-86. |
APA | Wang, Xiaoxin,Yan, Jiebing,Hu, Hongli,Gao, Xiangxiang,&Zhang, Xiao.(2013).Simulation and optimization of capacitance sensor based on orthogonal test.Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University,47([db:dc_citation_issue]),81-86. |
MLA | Wang, Xiaoxin,et al."Simulation and optimization of capacitance sensor based on orthogonal test".Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University 47.[db:dc_citation_issue](2013):81-86. |
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