Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films | |
Xiong, R; Li, ZY; Yang, XF; Peng, ZL; Wang, K; Tian, DC | |
刊名 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY |
2000 | |
卷号 | 76期号:1 |
关键词 | dielectric tensor magnetic film magneto-optic effect rotation angle reflectivity |
ISSN号 | 0921-5107 |
DOI | 10.1016/S0921-5107(00)00398-6 |
URL标识 | 查看原文 |
收录类别 | CPCI-S |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4128607 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Xiong, R,Li, ZY,Yang, XF,et al. Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films[J]. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,2000,76(1). |
APA | Xiong, R,Li, ZY,Yang, XF,Peng, ZL,Wang, K,&Tian, DC.(2000).Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films.MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,76(1). |
MLA | Xiong, R,et al."Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle theta(k) and the reflectivity R of double-layered films".MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 76.1(2000). |
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