Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults | |
Liu, Lifeng; Ding, Xiangdong; Sun, Jun; Li, Suzhi; Salje, Ekhard K. H. | |
刊名 | NANO LETTERS |
2016 | |
卷号 | 16期号:[db:dc_citation_issue]页码:194-198 |
关键词 | finite size scaling Cu-Al-Ni alloys size dependence of shape memory shape memory effect twinning stacking faults |
ISSN号 | 1530-6984 |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3230915 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Liu, Lifeng,Ding, Xiangdong,Sun, Jun,et al. Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults[J]. NANO LETTERS,2016,16([db:dc_citation_issue]):194-198. |
APA | Liu, Lifeng,Ding, Xiangdong,Sun, Jun,Li, Suzhi,&Salje, Ekhard K. H..(2016).Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults.NANO LETTERS,16([db:dc_citation_issue]),194-198. |
MLA | Liu, Lifeng,et al."Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults".NANO LETTERS 16.[db:dc_citation_issue](2016):194-198. |
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