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	Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates
	Jin, Xiao-Wei; Lu, Lu; Mi, Shao-Bo; Cheng, Sheng; Liu, Ming; Jia, Chun-Lin
刊名	JOURNAL OF ALLOYS AND COMPOUNDS
	2016
卷号	676页码:173-180
关键词	Planar defects Piezoelectric materials Transmission electron microscopy Thin films
ISSN号	0925-8388
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2963818
专题	西安交通大学
推荐引用方式 GB/T 7714	Jin, Xiao-Wei,Lu, Lu,Mi, Shao-Bo,et al. Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2016,676:173-180.
APA	Jin, Xiao-Wei,Lu, Lu,Mi, Shao-Bo,Cheng, Sheng,Liu, Ming,&Jia, Chun-Lin.(2016).Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates.JOURNAL OF ALLOYS AND COMPOUNDS,676,173-180.
MLA	Jin, Xiao-Wei,et al."Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates".JOURNAL OF ALLOYS AND COMPOUNDS 676(2016):173-180.

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