Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates | |
Jin, Xiao-Wei; Lu, Lu; Mi, Shao-Bo; Cheng, Sheng; Liu, Ming; Jia, Chun-Lin | |
刊名 | JOURNAL OF ALLOYS AND COMPOUNDS |
2016 | |
卷号 | 676页码:173-180 |
关键词 | Planar defects Piezoelectric materials Transmission electron microscopy Thin films |
ISSN号 | 0925-8388 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2963818 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Jin, Xiao-Wei,Lu, Lu,Mi, Shao-Bo,et al. Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2016,676:173-180. |
APA | Jin, Xiao-Wei,Lu, Lu,Mi, Shao-Bo,Cheng, Sheng,Liu, Ming,&Jia, Chun-Lin.(2016).Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates.JOURNAL OF ALLOYS AND COMPOUNDS,676,173-180. |
MLA | Jin, Xiao-Wei,et al."Atomic scale investigation of planar defects in 0.95Na(0.5)Bi(0.5)TiO(3)-0.05BaTiO(3) thin films on SrTiO3 (001) substrates".JOURNAL OF ALLOYS AND COMPOUNDS 676(2016):173-180. |
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