Characteristic recognition of IC chip's micro-topography defects based on image projection transformation and energy optimization modeling (EI收录) | |
Liang, Zhongwei[1]; Zhang, Chunliang[1]; Wang, Yijun[1]; Xiao, Zhongmin[1] | |
会议名称 | Advanced Materials Research |
会议日期 | December 7, 2010 - December 9, 2010 |
会议地点 | Guangzhou, China |
关键词 | Cameras CCD cameras Curve fitting Defects Industrial engineering Manufacture Optical projectors Optimization Reliability analysis Topography |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2063774 |
专题 | 华南理工大学 |
作者单位 | [1] School of Mechanical and Electrical Engineering, Guangzhou University, Guangzhou, China |
推荐引用方式 GB/T 7714 | Liang, Zhongwei[1],Zhang, Chunliang[1],Wang, Yijun[1],等. Characteristic recognition of IC chip's micro-topography defects based on image projection transformation and energy optimization modeling (EI收录)[C]. 见:Advanced Materials Research. Guangzhou, China. December 7, 2010 - December 9, 2010. |
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