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Analysis of electron transport in the nano-scaled Si, SOI and III-V MOSFETs: Si/SiO2 interface charges and quantum mechanical effects
期刊论文
IOP Conference Series: Materials Science and Engineering, 2019, 卷号: 504, 期号: 1
作者:
Islam, A.*
;
Kalna, K.
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/28
Novel GAA Si Nanowire p-MOSFETs With Excellent Short-Channel Effect Immunity via an Advanced Forming Process
期刊论文
IEEE Electron Device Letters, 2018
作者:
Zhang QZ(张青竹)
;
Yin HX(殷华湘)
;
Meng LK(孟令款)
;
Yao JX(姚佳欣)
;
Li JJ(李俊杰)
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2019/05/05
Temperature Dependence of Dynamic Performance Characterization of 1.2 kV SiC Power MOSFETs compared with Si IGBTs for Wide Temperature Applications
期刊论文
IEEE Transactions on Power Electronics, 2018
作者:
Qi, Jinwei
;
Yang, Xu
;
Li, Xin
;
Tian, Kai
;
Mao, Zhangsong
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/11/19
Cryogenic temperatures
Dynamic resistance
High-efficiency power conversions
High-frequency applications
Power conversion systems
SiC MOSFET
Switching characterization
Temperature applications
Characterization of 1.2 kV 4H-SiC power MOSFETs and Si IGBTs at cryogenic and high temperatures
会议论文
作者:
Tian, Kai
;
Qi, Jinwei
;
Mao, Zhangsong
;
Yang, Song
;
Song, Wenjie
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/11/19
Cryogenic temperatures
High temperature
Interface traps
Switching characteristics
Switching performance
Transfer characteristics
Trench mosfets
Wide temperature ranges
Dynamic Performance of 4H-SiC Power MOSFETs and Si IGBTs over Wide Temperature Range
会议论文
作者:
Qi, Jinwei
;
Tian, Kai
;
Mao, Zhangsong
;
Yang, Song
;
Song, Wenjie
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/11/26
MOSFETs
dynamic on-resistance
silicon carbide (SiC)
cryogenic temperature
switching transient
Experimental Investigation of Ballistic Carrier Transport for Sub-100-nm Ge n-MOSFETs
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Cheng, Ran
;
Yin, Longxiang
;
Wu, Heng
;
Yu, Xiao
;
Zhang, Yanyan
;
Zheng, Zejie
;
Wu, Wangran
;
Chen, Bing
;
Ye, Peide D.
;
Liu, Xiaoyan
;
Zhao, Yi
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Germanium MOSFETs
ballistic transport
pulsed IV
GeOI
self-heating effect
P-CHANNEL
Impact of quantum confinement on transport and the electrostatic driven performance of silicon nanowire transistors at the scaling limit
期刊论文
SOLID-STATE ELECTRONICS, 2017
Al-Ameri, Talib
;
Georgiev, Vihar P.
;
Sadi, Toufik
;
Wang, Yijiao
;
Adamu-Lema, Fikru
;
Wang, Xingsheng
;
Amoroso, Salvatore M.
;
Towie, Ewan
;
Brown, Andrew
;
Asenov, Asen
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
CMOS
Electrostatics
Nanowire transistors
Performance
Quantum effects
TCAD
GATE
SIMULATION
INVERSION
MULTIGATE
MOSFETS
NM
Fabrication and characterization of gate last Si MOSFETs with SiGe source and drain
学位论文
: KTH, 2017
作者:
Christensen,Björn
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  |  
浏览/下载:4/0
  |  
提交时间:2019/12/24
MOSFET
fabrication
gate
last
SiGe
source
and
drain
IDP
gate
epitaxy
MOSFET
fabrication
gate
last
SiGe
source
and
drain
IDP
gate
epitaxy
Electrical
Engineering
Electronic
Engineering
Information
Engineering
Elektroteknik
och
elektronik
Comprehensive comparison between silicon carbide MOSFETs and silicon IGBTs based traction systems for electric vehicles
期刊论文
APPLIED ENERGY, 2017, 卷号: 194, 页码: 626-634
作者:
Ding, Xiaofeng
;
Du, Min
;
Zhou, Tong
;
Guo, Hong
;
Zhang, Chengming
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/30
Silicon carbide (SiC)-MOSFETs
Silicon (Si)-IGBTs
Electric vehicle traction systems
Losses
Thermal
Anomalous electrical properties induced by hot-electron-injection in 130-nm partially depleted soi nmosfets fabricated on modified wafer
期刊论文
Ieee transactions on nuclear science, 2016, 卷号: 63, 期号: 5, 页码: 2731-2737
作者:
Dai, Lihua
;
Bi, Dawei
;
Ning, Bingxu
;
Hu, Zhiyuan
;
Song, Lei
收藏
  |  
浏览/下载:59/0
  |  
提交时间:2019/05/09
Buried oxide
Interface trap
Silicon ion implantation
Soi nmosfets
Total dose radiation
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