CORC

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CORC

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Surface texture and interior residual stress variation induced by thickness of YBa2Cu3O7-delta thin films 期刊论文
JOURNAL OF APPLIED PHYSICS, 2012, 卷号: 112, 期号: 5, 页码: 53903
Zeng, L; Lu, YM; Liu, ZY; Chen, CZ; Gao, B; Cai, CB
收藏  |  浏览/下载：11/0  |  提交时间：2013/04/17
Tailoring in-plane crystallographic orientation of epitaxial YBa2Cu3O7-x thin films having perpendicular c-axis texture 期刊论文
THIN SOLID FILMS, 2012, 卷号: 520, 期号: 9, 页码: 3651-3656
Zheng, L; Su, XD; Fan, J; Chen, YJ; Yang, XL; You, LX; Harris, VG
收藏  |  浏览/下载：63/0  |  提交时间：2013/04/17
Reel-to-Reel Deposition of Reactively Sputtered LaZrO Buffer Layers on Textured NiW Tapes for YBaCuO Coated Conductors 期刊论文
JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM, 2012, 卷号: 25, 期号: 4, 页码: 773-777
Fan, F; Lu, YM; Liu, ZY; Ying, LL; Cai, CB
收藏  |  浏览/下载：48/0  |  提交时间：2013/04/17
Surface texture and interior residual stress variation induced by thickness of YBa2Cu3O7-delta thin films 期刊论文
JOURNAL OF APPLIED PHYSICS, 2012, 卷号: 112, 期号: 5, 页码: 53903
Zeng, L; Lu, YM; Liu, ZY; Chen, CZ; Gao, B; Cai, CB
收藏  |  浏览/下载：17/0  |  提交时间：2013/05/10
Tailoring in-plane crystallographic orientation of epitaxial YBa2Cu3O7-x thin films having perpendicular c-axis texture 期刊论文
THIN SOLID FILMS, 2012, 卷号: 520, 期号: 9, 页码: 3651-3656
Zheng, L; Su, XD; Fan, J; Chen, YJ; Yang, XL; You, LX(重点实验室）; Harris, VG
收藏  |  浏览/下载：11/0  |  提交时间：2013/05/10
Synthesis and chlorine sensing properties of nanocrystalline hierarchical porous SnO2 by a phenol formaldehyde resin-assisted process 期刊论文
CRYSTENGCOMM, 2010, 卷号: 12, 期号: 4, 页码: 1280-1285
Wang, H; Xu, JQ; Pan, QY
收藏  |  浏览/下载：15/0  |  提交时间：2012/03/24
A method for AlCu interconnect electromigration performance predicting and monitoring 期刊论文
MICROELECTRONIC ENGINEERING, 2008, 卷号: 85, 期号: 3, 页码: 577-581
Zhang, WJ; Yi, LW; Chang, PY; Wu, J
收藏  |  浏览/下载：9/0  |  提交时间：2012/03/24
TEXTURE  LINES  FILMS  
Electromigration in Al interconnects and the challenges in ultra-deep submicron technology 期刊论文
ACTA PHYSICA SINICA, 2006, 卷号: 55, 期号: 10, 页码: 5424-5434
Zhang, WJ(张文杰）; Yi, WB（易万兵）; Wu, J（吴瑾）
收藏  |  浏览/下载：12/0  |  提交时间：2012/03/24
The influence of substrate bias in I-PVD process on the properties of Ti and Al alloy films 期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2006, 卷号: 17, 期号: 11, 页码: 931-935
Zhang, WJ; Yi, L; Tao, K; Ma, Y; Chang, PY; Wu, J
收藏  |  浏览/下载：9/0  |  提交时间：2012/03/24
A quick method for AlCu interconnect electromigration performance predicting and monitoring 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2006, 卷号: 21, 期号: 5, 页码: 633-637
Zhang,WJ; Yi,L; Tao,K; Ma,Y; Chang,PY; Mao,DL; Wu,J; Zou,SC
收藏  |  浏览/下载：12/0  |  提交时间：2012/03/24

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