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Epitaxial growth and characterization of oxide thin films 期刊论文
FOURTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS, 2000, 卷号: 4086, 页码: 382
Yang, GZ; Lu, HB; Zhao, T; Chen, F; Chen, ZH
收藏  |  浏览/下载:8/0  |  提交时间:2013/09/17
DIFFRACTION CHARACTERIZATION OF TOTALLY RELAXED, PARTIALLY RELAXED, AND UNRELAXED SEMICONDUCTOR STRAINED-LAYER SUPERLATTICES 期刊论文
JOURNAL OF APPLIED PHYSICS, 1992, 卷号: 72, 期号: 11, 页码: 5240
DUAN, XF; FUNG, KK
收藏  |  浏览/下载:9/0  |  提交时间:2013/09/17


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