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科研机构
半导体研究所 [29]
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期刊论文 [28]
会议论文 [1]
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2011 [1]
2009 [6]
2008 [1]
2006 [2]
2005 [2]
2003 [2]
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半导体物理 [29]
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2-5m InAs/GaSb superlattices infrared photodetector
期刊论文
hongwai yu jiguang gongcheng/infrared and laser engineering, 2011, 卷号: 40, 期号: 8, 页码: 1403-1406
Xu, Yingqiang
;
Tang, Bao
;
Wang, Guowei
;
Ren, Zhengwei
;
Niu, Zhichuan
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  |  
浏览/下载:21/0
  |  
提交时间:2012/06/14
Alignment
Atomic force microscopy
Atomic spectroscopy
Detectors
Epitaxial growth
Gallium alloys
Gallium arsenide
Indium arsenide
Infrared detectors
Molecular beam epitaxy
Molecular beams
Optoelectronic devices
Semiconducting gallium
Superlattices
Transmission electron microscopy
X ray diffraction
Distribution of dislocations in GaSb and InSb epilayers grown on GaAs (001) vicinal substrates
期刊论文
journal of applied physics, 2009, 卷号: 105, 期号: 9, 页码: art. no. 094903
Li MC
;
Qiu YX
;
Liu GJ
;
Wang YT
;
Zhang BS
;
Zhao LC
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  |  
浏览/下载:32/0
  |  
提交时间:2010/03/08
X-RAY-DIFFRACTION
MOLECULAR-BEAM-EPITAXY
FILMS
MISFIT
Strain and magnetic anisotropy of as-grown and annealed Fe films on c(4x4) reconstructed GaAs (001) surface
期刊论文
journal of applied physics, 2009, 卷号: 106, 期号: 1, 页码: art. no. 013911
作者:
Chen L
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  |  
浏览/下载:79/0
  |  
提交时间:2010/03/08
annealing
gallium arsenide
iron
magnetic anisotropy
magnetic epitaxial layers
magnetisation
molecular beam epitaxial growth
transmission electron microscopy
X-ray diffraction
Anisotropic strain relaxation of thin Fe film on c(4 x 4) reconstructed GaAs (001) surface
期刊论文
physica e-low-dimensional systems & nanostructures, 2009, 卷号: 42, 期号: 2, 页码: 150-153
作者:
Chen L
;
Zhang XH
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  |  
浏览/下载:34/0
  |  
提交时间:2010/04/04
Fe thin film
Anisotropic strain relaxation
Magnetic anisotropy
X-ray diffraction
UNIAXIAL MAGNETIC-ANISOTROPY
EPITAXIAL-GROWTH
GAAS(001)
DEVICES
Determination of MgO/AlN heterojunction band offsets by x-ray photoelectron spectroscopy
期刊论文
applied physics letters, 2009, 卷号: 94, 期号: 5, 页码: art. no. 052101
作者:
Wei HY
;
Jiao CM
;
Song HP
收藏
  |  
浏览/下载:238/41
  |  
提交时间:2010/03/08
aluminium compounds
conduction bands
energy gap
high electron mobility transistors
III-V semiconductors
magnesium compounds
passivation
semiconductor heterojunctions
valence bands
wide band gap semiconductors
X-ray photoelectron spectra
Effect of Anode Floating Voltage and its Applications in Characterizing Silicon Drift Detectors
期刊论文
chinese physics letters, 2009, 卷号: 26, 期号: 4, 页码: art. no. 042901
Wu GG
;
Li HR
;
Liang K
;
Yang R
;
Cao XL
;
Wang HY
;
An JM
;
Hu XW
;
Han DJ
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  |  
浏览/下载:79/31
  |  
提交时间:2010/03/08
GAMMA-RAY SPECTROSCOPY
X-RAY
SPECTROMETERS
Role of edge dislocation and Si impurity in linking the blue luminescence and yellow luminescence in n-type GaN films
期刊论文
applied physics letters, 2009, 卷号: 95, 期号: 4, 页码: art. no. 041901
作者:
Yang H
;
Wang H
;
Wang H
;
Wang YT
;
Yang H
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  |  
浏览/下载:64/1
  |  
提交时间:2010/03/08
edge dislocations
gallium compounds
III-V semiconductors
impurities
photoluminescence
semiconductor doping
semiconductor thin films
silicon
wide band gap semiconductors
X-ray diffraction
Effect of Interface Roughness and Dislocation Density on Electroluminescence Intensity of InGaN Multiple Quantum Wells
期刊论文
chinese physics letters, 2008, 卷号: 25, 期号: 11, 页码: 4143-4146
Zhao, DG
;
Jiang, DS
;
Zhu, JJ
;
Liu, ZS
;
Zhang, SM
;
Wang, YT
;
Yang, H
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2010/03/08
X-RAY-DIFFRACTION
EPITAXIAL GAN
DEPENDENCE
PHOTOLUMINESCENCE
GROWTH
FILMS
Interfaces in heterostructures of AlInGaN/GaN/Al2O3
期刊论文
superlattices and microstructures, 2006, 卷号: 39, 期号: 5, 页码: 429-435
Zhou SQ
;
Wu MF
;
Yao SD
;
Liu JP
;
Yang H
收藏
  |  
浏览/下载:47/0
  |  
提交时间:2010/04/11
nitride semiconductors
interface
Rutherford backscattering/channeling
transmission electron microscopy
x-ray diffraction
SUPER-LATTICES
STRAIN
GAN
As-doped p-type ZnO films by sputtering and thermal diffusion process
期刊论文
journal of applied physics, 2006, 卷号: 100, 期号: 4, 页码: art.no.043704
Wang P (Wang Peng)
;
Chen NF (Chen Nuofu)
;
Yin ZG (Yin Zhigang)
;
Yang F (Yang Fei)
;
Peng CT (Peng Changtao)
;
Dai RX (Dai Ruixuan)
;
Bai YM (Bai Yiming)
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  |  
浏览/下载:40/0
  |  
提交时间:2010/04/11
RAY-PHOTOELECTRON-SPECTROSCOPY
INAS SURFACES
FABRICATION
DEPOSITION
LAYERS
OXIDE
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